Compositional studies of optical parameters in (Ag3AsS3)x(As2S3)1–x (x = 0.3; 0.6; 0.9) thin films
Journal Title: Semiconductor Physics, Quantum Electronics and Optoelectronics - Year 2016, Vol 19, Issue 4
Abstract
(Ag3AsS3)x(As2S3)1–x (x = 0.3; 0.6; 0.9) thin films were deposited onto a silica substrate by rapid thermal evaporation. The amount of Ag-rich crystalline phase precipitates on the surfaces of the films increases with Ag3AsS3 content. It has been shown that the absorption edge spectra are described by the Urbach rule. The temperature behaviour of absorption spectra was studied, the temperature dependences of energy position of absorption edge and Urbach energy were also investigated. The influence of compositional disordering due to Ag3AsS3 introduction into As2S3 on the optical parameters of (Ag3AsS3)x(As2S3)1–x thin films were analyzsed. The spectral, temperature and compositional behaviour of refractive index for (Ag3AsS3)x(As2S3)1–x thin films were studied.
Authors and Affiliations
I. P. Studenyak, M. Kranjčec, M. M. Kutsyk, Yu. O. Pal, Yu. Yu. Neimet, V. Yu. Izai, I. I. Makauz, C. Cserhati, S. Kökényesi
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