Electric Noise and Semiconductor Reliability
Journal Title: Asigurarea Calităţii – Quality Assurance - Year 2017, Vol 0, Issue 89
Abstract
Low-frequency electrical noise is a sensitive measure of defects in semiconductor devices because the noise has an impact, directly or indirectly, on the performance and reliability of the device. Its measurement is particularly important to characterize noise in semiconductor devices.
Authors and Affiliations
Titu-Marius I. BĂJENESCU
Keywords
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