Inspiration coming from a paper of A. Boutet de Monvel, J. Janas, and S. Naboko / Inspiracja badawcza wynikająca z niedawnej pracy A. Boutet de Monvel, J. Janasa i A. Naboko
Journal Title: Bulletin de la Société des sciences et des lettres de Łódź, Série: Recherches sur les déformations - Year 2017, Vol 0, Issue 2
Abstract
We present our talk at the round table discussion at the Hypercomplex Seminar 2016 (Będlewo, Poland). The note describes an inspiration related with elementary models of unbounded Jacobi martices with with a few bounded gaps.
Authors and Affiliations
Andrei V. Pokrovskii
Some estimations of the Łojasiewicz exponent for polynomial mappings on semialgebraic sets / Pewne szacowania wykładnika Łojasiewicza dla odwzorowań wielomianowych na zbiorach semialgebraicznych
We strengthen some estimations of the local and global Lojasiewicz exponent for polynomial mappings on closed semialgebraic sets obtained by K. Kurdyka, S. Spodzieja and A. Szlachcińska in [4].
An algebra governing reduction of quaternary structures to ternary structures III. A study of generators of the resulting algebra
By applying the reduction matrices of Part I we analyzed in Part II the multiplication tables of generators of the cubic and nonion algebras, deduced the remaining 3 x 3 sub- tables for the resulting algebra, determined...
Nonclassical parameters in kernel estimation
In kernel method, using in estimation as well as in hypothesis testing problems, two parameters should be fixed: kernel function and smoothing parameter. Some methods of kernel estimation and methods of choosing kernel p...
Molecular organization in pentacene thin film on SiO2 surface using spec-troscopic ellipsometry, infrared spectroscopy, and atomic force microscopy / Organizacja molekularna w warstwie pentacenu osadzonej na powierzchni SiO2 przebadana elipsometrią , spektroskopią podczerwieni i mikroskopią sił atomowych
Thin films of pentacene of 32-nm thickness obtained by organic molecular beam depo- sition (OMBD) in high vacuum conditions onto silicon/native silica (Si/SiO2) and fused silica substrates were examined. Anisotropic opti...
Heavy ions sputtering and implantation of surface monitored with PIXE / Rozpylanie ciężkimi jonami i implantacja powierzchni monitorowana przy pomocy PIXE
Characteristic X-rays emitted from surfaces and specially prepared thin films as a result of impact of slow heavy ions were measured and analysed. Kinematics of the interaction was simulated numerically with stopping and...