Integrated Test Frame Work for defect free Embedded Product delivery
Journal Title: IOSR Journals (IOSR Journal of Computer Engineering) - Year 2014, Vol 16, Issue 3
Abstract
Abstract:Now a days, the industries are looking for zero defect embedded products.Of late the companies are recalling the products due to the non functioning and performance of the products up to their expectations as per the design conditions and estimations. So many uncovered defects are highlighted even their operation which eventually triggers the products recall later times. Recently M/s Toyota recalled 60 lacks vehicles globally for non functioning wheel cable.With this we can get a question that “Are all delivered products are defect free?” Probably, answer would be Not. Even Though organizations spending lot off investment during product life cycle. Due to this embedded product margin being minimized to the manufacturing Industries and is going to be a non profit product.Hence there is immense need to deliver defect free product by the manufacturers .There is a need to maintain or adopt sophisticated/test Proven test process, test coverage techniques.This paper proposes an integrated test frame work which fills the gap among Test levels, process, Testcoverage,Prototype testing, Virtual testing model based testing etc,… to deliver defect free embedded product
Authors and Affiliations
A. chandra suresh , Dr. Kvnm. Prasad
Keywords
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- EP ID EP131758
- DOI 10.9790/0661-163312128
- Views 86
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