Engineering of refraction index profile of planar metal-dielectric waveguide
Journal Title: Вісник НТУУ КПІ. Серія Радіотехніка, Радіоапаратобудування - Year 2010, Vol 0, Issue 40
Abstract
Engineering of refraction index profile for planar metal-dielectric waveguide is performed.
Authors and Affiliations
V. Levandovskyy
Keywords
Related Articles
- EP ID EP309502
- DOI 10.20535/RADAP.2010.40.108-112
- Views 65
- Downloads 0
Block diagram of the improved continuous glucose monitoring system of human’s blood
Introduction. The glucose monitoring is an important issue diagnostic of diabetes. Based on analysis of the devices continuous glucose monitoring system Guardian REAL-Time selected for improvement. Research results. Desi...
Wideband bioimpedance meter with the adaptive selection of frequency grid
Introduction. For the diagnosis of functional state and structure of biological objects with weakly expressed irregularities it is important quickly and accurately to determine the amplitude- and phase-frequency characte...
Experimental assessment of validity of eddy current inspection
Experiment has been executed for the purpose of optimization of diagnostic equipment kit. Numerical values of validity of threshold inspection (of coating thickness, roughness, structure, composition and thickness of met...
The delta-models of reactive elements and low-pass filters
Frequency limitations of lumped and distributed reactive elements traditional models are considered. Based on equivalent ciruit of infinitely short transmission line section inductance and capacitance models with propert...
Radiometric quality evaluation of dielectric materials
Introduction. The problem statement. It is neseccary to investigate the chemical composition, density and integrity of the product designing products of special purpose. The control of these characteristics without the i...