Accurate Dielectric Capacitance Determination from MetalInsulator-Semiconductor Devices Having Bias and Frequency Dependent Conductance Due To Leakage Current Journal title: IOSR Journals (IOSR Journal of Electrical and Electronics Engineering) Authors: Ravi Kumar Chanana Subject(s):
Polysilicon and Metal-Gated N-Channel Grounded Si Mosfets As Devices To Characterise MIS Structures By The BOEMDET Technique Journal title: IOSR Journal of Applied Physics (IOSR-JAP) Authors: Dr. R. K. Chanana Subject(s):
